PEC430: Advanced Topics in Physics: Theoretical

This unit investigates the theory behind the surface analysis methods used in materials science. The introduction deals with solid surfaces, their structure and composition and UHV basics. There is a section on analysis techniques, for example electron microscopy, sputter depth profiling, SIMS, AES, XPS, scanning probe microscopy and LEED. The final section looks at some of the applications for which these techniques can be used e.g. investigating semiconductor devices and thin film analysis.

Points	4
Enrolment Options	Murdoch: S1-internal, S1-external
Contact Time	Lectures/tutorials: 3 hours per week.
Prerequisites	M231/PEC231 Modern Physics (previously M211/Physics 2A: Quantum Physics) and PEC317 Physics of Materials. Co-requisite: Internet access if studying externally.
School	School of Engineering and Energy
Unit Coordinator	Dr Chris Creagh Position: Lecturer E-mail: C.Creagh@murdoch.edu.au Location: Murdoch Campus Physical Sciences Room 2.035 Phone: Prefix: +618 9360 6715
Unit Contacts	Contact Phone Prefix: +618 Location Explanation of Location Codes Teaching Period(s) Dr Chris Creagh Lecturer (C.Creagh@murdoch.edu.au) 9360 6715 Murdoch Campus Physical Sciences Room 2.035 MURDOCH S1: Internal (15/02/2010 - 11/06/2010)   MURDOCH S1: External (15/02/2010 - 11/06/2010)

Check the Teaching Timetable Search for a Booklist for PEC430 View Reserve and ECMS resources for PEC430 View further details in the Handbook

Key to Offshore Campus Location abbreviations: APMISIN Asia Pacific Management Institute (Singapore) CEJTOKYO Chiropractic Education Japan (Tokyo) JKURASHIKI NET Corporation (Kurashiki, Japan) KDUPG KDU College (Penang, Malaysia) KDUPJ KDU College (Petaling Jaya, Malaysia) SGP-REPOLY Republic Polytechnic (Singapore) SMANUFED Singapore Manufacturing Federation ZHENGZHOU Zhengzhou University (China)